IDDT test generation algorithm based on chaotic search
一种基于混沌搜索的I_（DDT）测试产生算法

This paper proposed a new algorithm for transient current test (IDDT) generation. The algorithm used backward implication in improved FAN algorithm to activate fault and mapped test vector space to the chaotic space, adopted chaotic search to find out the suitable testing pairs. SPICE simulation experiments were done on the test vectors generated by this algorithm. The simulation results show that it is available to use chaotic search for IDDT test generation.