ELECTRON SPECTROSCOPIC STUDY ON PRECISE BEARING SURFACES

The compositions and structures of the oxide films on three typical precise bearings have been investigated by means of Auger electron spectroscopic depth profile analysis as well as deconvolution and peak decomposition investigation of X-ray photoelectron spectroscopic depth profile. The results show that the bearing with best mechanical properties possesses the thinnest oxide film which is rich in C and poor in P, S impurities.