THE ELECTRO OPTIC SAMPLING MEASUREMENT WITH MULTIPLE FREQUENCY PHASE SHIFT SCANNING METHOD
倍频移相扫描法电光采样测量

The principle of multiple frequency phase shift scanning method was analyzed. The electro optic sampling system constructed with the multiple frequency phase shift scanning method was introduced. An integrated circuit chip of high speed GaAs dynamic freqnency dividing circuit was measured, and the measured frequency dividing waveform was presented.