Diffusion mechanism in Ag--TCNQ thin film with copper as tracers
Ag-TCNQ金属/有机双层膜中的扩散机制

Metal-organic thin films (Ag-TCNQ) were prepared by successive vacuum evaporation of Ag and TCNQ. The tracer method, with Cu as tracers, was established and used to investigate the diffusion behavior in Ag-TCNQ complex because Cu exhibits the same properties as Ag when reacting with TCNQ. The depth profiles of the thin films were measured by secondary ion mass spectroscopy (SIMS). SIMS analysis showed that there exist ion exchange between Cu and Ag, which is different from the clear interface between Cu and Ag in the metal films. The diffusion mechanism in Ag-TCNQ thin film is silver diffusion accompanying with ion exchange.