Thermal Spectrum Analysis Method for Infrared Thermogram of Transistors
晶体管红外热像图的热谱分析方法

The infrared thermograms of transistors are investigated according to the colorimetric method.The thermal spectrum curves and one-dimension temperature distribution curves are given from the thermal spectrum analysis.The junction-temperature distribution of the emitter region of the transistors,peak junction temperature,and minimum junction temperature are briefly shown and the average junction temperature is calculated through the one-dimension temperature distribution curves.Transistor thermal spectrum,as a new method,different from the commonly infrared thermogram,is introduced to characterize the non-uniform property of the junction temperature distribution.