An Improved Model and Method of Calculating the VLSI Critical Area
一种改进的VLSI关键面积计算模型和方法

Fault mechanism of available critical area model is studied.An improved fault-kernel of open/short defect is presen- ted, which is suitable for the critical area calculation of general VLSI layout structure.It is important to the calculation of VLSI critical area and the optimization of IC layout design.