SPIN DEFECT STATES IN HYDROGENATED AMORPHOUS GERMANIUM-CARBON FILMS
氢化非晶锗碳薄膜中的自旋缺陷态

Using in situ electron spin resonance(ESR) technique, we have studied the type, the density, the temperature dependence and the thermal dynamic behavior of defects in rf-reactively sputtered a-Ge1-xCx: H films. In the decomposition process of the ESR spectra, we found that the spectra have an asymmetrical component. Quantitative analysis of the component and the explanation of its origin are given.