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OALib Journal期刊
ISSN: 2333-9721
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Photoelectrochemical etching of uniform macropore array on full 5-inch silicon wafers
光电化学刻蚀法在整个5英寸硅片上制作均匀深孔阵列

Keywords: photoelectrochemical etching,macropore array,large area,non-uniformity,current density
光电化学刻蚀
,宏孔阵列,大面积,不均匀性,电流密度

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Abstract:

We analyze the two main factors causing non-uniformity of the etched macropore array first, and then a novel photoelectrochemical etching setup for large area silicon wafers is described. This etching setup refined typical etching setups by a water cooling system and a shower-head shaped electrolyte circulator. Experimental results showed that the uniform macropore array on full 5-inch n-type silicon wafers could be fabricated by this etching setup. The morphology of the macropore array can be controlled by adjusting the corresponding etching parameters.

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