%0 Journal Article
%T 中文版考试焦虑量表(PAF)的修订及信度效度检验<br>Reliability and Validity of the Revised Chinese Version of the Test Anxiety Scale (PAF)
%A 斯琢然
%A 王广新
%J Advances in Psychology
%P 196-205
%@ 2160-7281
%D 2024
%I Hans Publishing
%R 10.12677/ap.2024.145303
%X 目的：引进目前国际广泛使用测量考试焦虑四因素模型的德国考试焦虑量表(Prufungsangstfragebogen, PAF)并检验其效度和信度。方法：选取高中生1300名，检验PAF量表的结构效度、效标效度和内容一致性信度，使用学业自我效能感量表以及艾森克人格问卷简式量表神经质分量表为效标工具。结果：探索性因素分析得出包括担忧、干扰、缺乏自信和情绪性在内的四因素结构，验证性因素分析显示四因素模型拟合良好(<i>χ2</i>/df = 3.71, CFI = 0.94, TLI = 0.93, RMSEA = 0.07)；量表具有良好的区分效度和会聚效度；PAF总分及各维度与学业自我效能感呈负相关，与神经质呈正相关(<i>p</i><i> </i>&lt; 0.01)，均具有统计学意义。总量表的Cronbach’s <i>α</i>系数为0.9。结论：PAF量表具有较好的跨文化适应性，在中文样本中显示出良好的信度和效度，可以作为高中生考试焦虑水平的测量工具。<br />
Objective: To introduce and test validity and reliability of the German Test Anxiety Scale (Prufungsangstfragebogen, PAF), which is now widely used to measure the four-factor model of test anxiety. Method: Totally 1300 high school students were selected and the data were analyzed with confirmatory factor analysis, criterion validity analysis and internal consistency reliability test. The Academic Self-Efficacy Scale and the Eysenck Personality Questionnaire-R Short Scale (EPQ-RSC) neuroticism were used as calibration tools. Results: Exploratory factor analysis yielded a four- factor structure including worry, interference, emotionality and lack of confidence. Confirmatory factor analysis showed four-factor model of the PAF (χ2/df = 3.71, CFI = 0.94, TLI = 0.93, RMSEA = 0.07). The scale had good discriminate and convergent validity; and the total scores and dimensions of the PAF were negatively correlated with academic self-efficacy, and positively correlated with the scores of EPQ-RSC neuroticism (<i>p</i> &lt; 0.01). The Cronbach’s α coefficient was 0.9 for the total scale. Conclusion: The PAF scale shows good reliability and validity in Chinese samples, and can be used as a measure of test anxiety levels in high school students.
%K 考试焦虑量表，PAF，高中生，信度，效度<br>Test Anxiety Scale
%K PAF
%K Senior High School Student
%K Validity
%K Reliability
%U http://www.hanspub.org/journal/PaperInformation.aspx?PaperID=87051