%0 Journal Article %T Cu、Sn掺杂的沟道型β-Ga2O3半导体薄膜光电器件的制备及特性研究
Preparation and Characterization of Channeled β-Ga2O3 Semiconductor Thin Film Optoelectronic Devices Doped with Cu and Sn Elements %A 刘畅 %A 刘俊 %A 刘源 %A 胡馨月 %A 李旺 %A 柳婕 %A 李梦轲 %J Material Sciences %P 200-212 %@ 2160-7621 %D 2023 %I Hans Publishing %R 10.12677/MS.2023.133024 %X 本文利用双靶射频磁控溅射技术,在不同实验条件下,开展了本征β-Ga2O3和Cu、Sn掺杂的沟道型β-Ga2O3半导体薄膜光电器件的制备及特性研究工作。分析了掺杂前后制备的二维β-Ga2O3薄膜的微结构、表面形貌及化学成份。比较了不同条件下制备器件的电导率、IV特性及光电特性。研究发现,Cu、Sn掺杂后,β-Ga2O3半导体薄膜光电器件的电导率、IV特性和光电特性都有一定的改善,而Sn掺杂的Sn/β-Ga2O3薄膜的电导率增加幅度最大。其中,Sn/β-Ga2O3器件呈现了最佳IV特性,说明Sn掺杂比Cu掺杂的效果更好。同时,掺杂并进行退火处理更可使薄膜的电导率呈现数量级的提升。制备的不同二维沟道型器件都具有明显的场效应器件特征,可用外加底栅电压VGS调控器件的源漏电流IGS。在254 nm的紫外光源辐照下,所有器件都出现了明显的光电流。但掺杂后器件的光电流明显高于本征器件的光电流,Sn掺杂Sn/β-Ga2O3器件的光电流最大,响应时间最短,光电流与暗电流之比可达112,器件具有更好的稳定性和可逆性。
In this work, the channeled intrinsic, Cu- and Sn-doped β-Ga2O3 semiconductor thin film optoelectronic devices were fabricated under different experi-mental conditions by double target RF magnetron sputtering technology. The characteristics of the prepared β-Ga2O3 thin films and optoelectronic devices before and after doping were systematically investigated, including the microstructure, surface morphology, chemical composition of the 2D β-Ga2O3 thin films as well as the photo-electric properties of the devices. It was found that the per-formances of the Cu- and Sn-doped channeled β-Ga2O3 optoelectronic devices were significantly im-proved, such as the conductivity, IV and photoelectric characteristic. Especially, the conductivity of Sn-doped β-Ga2O3 thin films showed the largest increase and exhibited a typical IV characteristic, which indicates that the properties of β-Ga2O3 films can be improved by Sn-doping compared to Cu doping. Moreover, doping and annealing methods can increase the conductivity of the β-Ga2O3 thin films by orders of magnitude. The results showed that the different two-dimensional channeled op-toelectronic devices have an obvious field effect device characteristic, and the IGS of the optoelec-tronic devices can be controlled by the back gate voltage. All of the as-prepared devices have a good response to the ultraviolet (UV) %K β-Ga2O3,掺杂,半导体器件,光电特性
β-Ga2O3 %K Doped %K Semiconductor Devices %K Optoelectronic Characterization %U http://www.hanspub.org/journal/PaperInformation.aspx?PaperID=63102