%0 Journal Article
%T High-energy heavy ion testing of VLSI devices for single event upsets and latch up
%A G R Joshi
%A M Ravindra
%A R Damle
%A R Sandhya
%A S B Umesh
%A S R Kulkarni
%J -
%D 2005
%U https://www.ias.ac.in/describe/article/boms/028/05/0473-0476