%0 Journal Article
%T Ellipsometric characterization of Cd1a£¿£¿xMnx Te thin films in the presence of perturbative fields
%A A C Rastogi
%A L K Malhotra
%A Sharat Chandra
%J -
%D 1996
%U https://www.ias.ac.in/describe/article/boms/019/01/0139-0145