%0 Journal Article
%T Non-destructive, high-content analysis of wheat grain traits using X-ray micro computed tomography
%A Callum P. Scotson
%A Candida Nibau
%A Colin Sauze
%A Fiona Corke
%A John H. Doonan
%A Karen Askew
%A Kevin Williams
%A Nathan Hughes
%J Archive of "Plant Methods".
%D 2017
%R 10.1186/s13007-017-0229-8
%X The online version of this article (doi:10.1186/s13007-017-0229-8) contains supplementary material, which is available to authorized users
%K X-ray micro computed tomography
%K ¦ĚCT
%K Image analysis
%K 3D vision
%K Grain traits
%K Wheat
%K Temperature
%U https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5664813/