%0 Journal Article
%T Studying the Adhesion Force and Glass Transition of Thin Polystyrene Films by Atomic Force Microscopy
%A Aoli Wu
%A Hua Kang
%A Li Guan
%A Meining Zhang
%A Mingdong Dong
%A Qiang Li
%A Xiaoqin Qian
%J Archive of "Nanoscale Research Letters".
%D 2018
%R 10.1186/s11671-017-2426-9
%X Schematic illustration of adhesion force measurement for normal thin polymer films supported on silicon substrate. The AFM tip a firstly approaches the sample surface at a discrete distance above the sample, b continues to approach until the tip touches the sample surface, c begins to deform the sample surface under a load force and shows a small indentation and d¨Ce withdraws from the sample surfac
%K Adhesion Force
%K Glass Transition Temperature
%K Polystyrene
%K Atomic Force Microscope (AFM)
%K Force Distance Curves
%U https://www.ncbi.nlm.nih.gov/pmc/articles/PMC5760485/