%0 Journal Article
%T Manufacturing and Electrical Characterization of
MOS Devices of Ultrathin Silicon Dioxide Layer
%A Anis M. Saad
%J Journal Information: ISSN: Frequency: Journal DOI: Peer-review model: Digital Archiving: Disclaimer: Disclaimer:
%D 2018
%R 10.9734/PSIJ/2018/44368
%X Reviewers:
%U http://www.sciencedomain.org/abstract/27218