%0 Journal Article
%T Oversample Reconstruction Based on a Strong Inter-Diagonal Matrix for an Optical Microscanning Thermal Microscope Imaging System<br>Oversample Reconstruction Based on a Strong Inter-Diagonal Matrix for an Optical Microscanning Thermal Microscope Imaging System
%A Meijing Gao
%A Ailing Tan
%A Jie Xu
%A Weiqi Jin
%A Zhenlong Zu
%A Ming Yang
%J 北京理工大学学报（自然科学中文版)
%D 2018
%R 10.15918/j.jbit1004-0579.201827.0109
%X Based on a strong inter-diagonal matrix and Taylor series expansions, an oversample reconstruction method was proposed to calibrate the optical micro-scanning error. The technique can obtain regular 2×2 microscanning undersampling images from the real irregular undersampling images, and can then obtain a high spatial oversample resolution image. Simulations and experiments show that the proposed technique can reduce optical micro-scanning error and improve the system's spatial resolution. The algorithm is simple, fast and has low computational complexity. It can also be applied to other electro-optical imaging systems to improve their spatial resolution and has a widespread application prospect.<br>Based on a strong inter-diagonal matrix and Taylor series expansions, an oversample reconstruction method was proposed to calibrate the optical micro-scanning error. The technique can obtain regular 2×2 microscanning undersampling images from the real irregular undersampling images, and can then obtain a high spatial oversample resolution image. Simulations and experiments show that the proposed technique can reduce optical micro-scanning error and improve the system's spatial resolution. The algorithm is simple, fast and has low computational complexity. It can also be applied to other electro-optical imaging systems to improve their spatial resolution and has a widespread application prospect.
%K optical microscanning strong inter-diagonal matrix oversample reconstruction thermal microscope imaging system&lt
%K br&gt
%K optical microscanning strong inter-diagonal matrix oversample reconstruction thermal microscope imaging system
%U http://journal.bit.edu.cn/yw/bjlgyw/ch/reader/view_abstract.aspx?file_no=20180108&flag=1