%0 Journal Article
%T 运用t检验评估3DES算法的侧信道信息泄露<br>Evaluating side-channel information leakage in 3DES using the t-test
%A 陈佳哲
%A 李贺鑫
%A 王亚楠
%A 王宇航
%J 清华大学学报（自然科学版）
%D 2016
%R 10.16511/j.cnki.qhdxxb.2016.25.007
%X t检验是统计学中用来检验2个未知方差正态总体均值关系的假设检验方法。当总体的方差不相等, 且样本量也不相等时, Welch t检验是一种比Student's t检验更可靠的方法。该文将借鉴采用t检验对AES的实现进行侧信道信息泄露评估的方法, 用Welch t检验来对3DES算法运行过程中的侧信道信息泄露进行评估, 以衡量其是否可能受到一阶DPA攻击。该文构造了适合于3DES算法的Welch t检验方法, 并对实现方法不同的3个运行3DES算法的设备进行了实验。实验结果表明该文的方法是有效的。<br>Abstract：The t-test is a hypothesis test that deals with two Gaussian samples with unknown variances. When the two samples have unequal variances and unequal sample sizes, the Welch t-test is more reliable than the Student's t-test. This paper evaluates the 1st order side-channel information leakage of 3DES with an AES type t-test. Welch t-tests suitable for evaluating 3DES are given with tests on three different devices that show this method is effective.
%K Welch t检验
%K 3DES算法
%K 侧信道
%K 信息泄露评估
%K &lt
%K br&gt
%K Welch t-test
%K 3DES algorithm
%K side-channel
%K information leakage evaluation
%U http://jst.tsinghuajournals.com/CN/Y2016/V56/I5/499