%0 Journal Article
%T <br>
%A 刘梦溪
%A 李世超
%A 查泽奇
%A 裘晓辉
%J 物理化学学报
%D 2017
%R 10.3866/PKU.WHXB201609282
%X 原子力显微镜（AFM）通过探测针尖与样品之间的相互作用力获得样品表面的结构信息。基于qPlus传感器的非接触原子力显微镜（NC-AFM）在传统AFM的基础上进一步提升了空间分辨率，为研究表面物理和化学过程提供了一种新的成像和谱学研究技术。本文首先介绍NC-AFM的基本构造、高分辨成像机制和力谱测量等工作原理，总结了近年来NC-AFM在表面在位化学反应、低维材料表征和表面电荷分布测量等方面的应用，探讨了NC-AFM技术的发展与完善，展望了NC-AFM面临的机遇和挑战。<br>Atomic force microscopy (AFM) is used to investigate surface structures by measuring the interaction force between the tip and sample. Non-contact AFM (NC-AFM) that incorporates a qPlus sensor further enhances the spatial resolution of scanning probe microscopy based on traditional AFM principles. In this perspective, we give a brief introduction to the mechanisms of high-resolution imaging and force measurements using NC-AFM. We then summarize recent applications of NC-AFM in the fields of on-surface chemical reactions, low-dimensional materials, surface charge distribution in molecules, as well as technical improvements and developments of NC-AFM technologies. The opportunities and challenges for NC-AFM technologies are also presented
%U http://www.whxb.pku.edu.cn/CN/Y2017/V33/I1/183