%0 Journal Article %T 行波效应对大跨连续刚构桥易损性影响分析<br>Fragility Analysis of Large-Span Continuous Rigid Bridge Considering Wave Passage Effectt %A 陈志伟 %A 蒲黔辉 %A 李晰 %A 陈志强 %A 贾宏宇< %A br> %A CHEN Zhiwei %A PU Qianhui %A LI Xi %A CHEN Zhiqiang %A JIA Hongyu %J 西南交通大学学报 %D 2017 %R 10.3969/j.issn.0258-2724.2017.01.004 %X 为了分析地震动的行波效应对山区大跨连续刚构桥易损性的影响，以西南地区某高墩大跨连续刚构桥为研究对象，采用谱兼容的方法选取了20条地震记录对桥梁结构进行了一致激励和多点激励下的增量动力分析，并得到其易损性曲线.研究结果表明：墩高越高，桥墩相对位移越大，最高墩的相对位移为矮墩的1.03~2.81倍，但矮墩发生损伤的概率要大于高墩，在抗震设计中应得到重视；与一致激励相比较，考虑行波效应时，矮墩发生轻微损伤和中等损伤的概率降低，高墩发生轻微损伤和中等损伤的概率增大，但行波效应会同时增加矮墩和高墩发生严重损伤的概率，因此在高墩桥的抗震设计中，特别是在高烈度地区，应考虑行波效应对桥梁结构的影响.<br>： To study wave passage effect on the fragility of the large-span continuous rigid bridge (LSCRB) in mountainous area, an actual LSCRB in southwest area was chosen as the study object. Twenty earthquake records were selected using the spectra-compatible method. Then, incremental dynamic analysis (IDA) of the bridge structure was conducted under uniform excitations and non-uniform excitations to obtain the fragility curves. The analysis results show that the relative displacements of the piers increase with the height of piers, and the relative displacement of the highest pier is around 1.03-2.81 times that of low pier, but the seismic design of low piers should be paid more attention because the damage probability of low piers is greater than that of high piers. Compared with the case under uniform excitations, the wave passage effect may reduce the probabilities of slight and moderate damages of low piers, and increase those of high piers. Furthermore the probability of extensive damage may be increased by the wave passage effect both for the low and high piers. As a result, in the seismic design of the high-pier bridges, it is necessary to consider the effect of wave passage on bridge structure, especially for the high-intensity zones %K 高墩桥 %K 增量动力分析 %K 行波效应 %K 损伤概率 %K 易损性 %K < %K br> %K high-pier bridges %K incremental dynamic analysis %K wave passage effect %K damage probability %K fragility %U http://manu19.magtech.com.cn/Jweb_xnjd/CN/abstract/abstract12370.shtml