%0 Journal Article
%T X-Ray Powder Diffraction: Why Not Use CuK¦Â Radiation?
%A Hans Hermann Otto
%J Journal of Analytical Sciences, Methods and Instrumentation
%P 37-47
%@ 2164-2753
%D 2018
%I Scientific Research Publishing
%R 10.4236/jasmi.2018.83004
%X Cu<i>K¦Â</i> radiation with a wavelength of <i>¦Ë</i> = 1.3923 ? is recommended for crystal structure determination from <i>X</i>-ray powder diffraction using the <i>Rietfeld</i> method. A highly sensitive image plate detector is able to collect enough intensity to record a brilliant <i>X</i>-ray powder pattern in a reasonable time, compared to Cu<i>K¦Á1</i> radiation used today. Especially atomic displacement coefficients could be determined more precisely with the much greater number of reflections recorded. A double-radius <i>Guinier</i> camera attached to a micro-focus rotating anode tube ensures increased brilliance besides high resolution. A simple construction specification is presented to make smart cylindrically bent Ge(111) or Si(111) <i>X</i>-ray monochromators that deliver focused Cu<i>K¦Â</i> radiation. The highly linear response of image plate detectors allows removing of fluorescence radiation simply as background of the pattern. The proposed equipment is a cost-efficient alternative to a liquid gallium-metal-jet <i>X</i>-ray source with maximum power load and a similar wavelength of <i>¦Ë</i>(Ga<i>K¦Á1</i>) = 1.34013 ?.
%K &lt
%K i&gt
%K X&lt
%K /i&gt
%K -Ray Diffraction
%K &lt
%K i&gt
%K Rietfeld&lt
%K /i&gt
%K Analysis
%K Cu&lt
%K i&gt
%K K¦Â&lt
%K /i&gt
%K Radiation
%K &lt
%K i&gt
%K Guinier&lt
%K /i&gt
%K Method
%K Focusing Monochromators
%K &lt
%K i&gt
%K X&lt
%K /i&gt
%K -Ray Diffraction Equipment Construction
%U http://www.scirp.org/journal/PaperInformation.aspx?PaperID=87257