%0 Journal Article
%T Permittivity Measurement of Low-Loss Substrates Based on Split Ring Resonators
%A Jianyi Li
%J World Journal of Engineering and Technology
%P 62-68
%@ 2331-4249
%D 2017
%I Scientific Research Publishing
%R 10.4236/wjet.2017.54B007
%X <div style=\"text-align:justify;\">
	In this paper, we present the complex permittivity measurement of low-loss substrates based on a microstrip-line-excited split-ring resonator (SRR). Permittivity of an unknown substrate is calculated based on the change in oscillation frequency of SRR caused by the material-under-test (MUT) above the SRR. Theoretical analysis and results of the simulations and experiments demonstrate the microstrip-line-excited SRR can be used to effectively improve measurement sensitivity. Simple equations for measurement of low-loss substrates using SRR are proposed and experimentally verified.
</div>
%K Split-Ring Resonators (SRR)
%K Permittivity
%K Non-Contact Measurement
%U http://www.scirp.org/journal/PaperInformation.aspx?PaperID=79548