%0 Journal Article
%T Optical, XPS and XRD Studies of Semiconducting Copper Sulfide Layers on a Polyamide Film
%A Valentina Krylova
%A Mindaugas Andrulevi ius
%J International Journal of Photoenergy
%D 2009
%I Hindawi Publishing Corporation
%R 10.1155/2009/304308
%X Copper sulfide layers were formed on polyamide PA 6 surface using the sorption-diffusion method. Polymer samples were immersed for 4 and 5 h in 0.15 mol⋅ dm£¿3 K2S5O6 solutions and acidified with HCl (0.1 mol⋅ dm£¿3) at 20¡ãC. After washing and drying, the samples were treated with Cu(I) salt solution. The samples were studied by UV/VIS, X-ray diffraction (XRD) and X-ray photoelectron spectroscopy (XPS) methods. All methods confirmed that on the surface of the polyamide film a layer of copper sulfide was formed. The copper sulfide layers are indirect band-gap semiconductors. The values of bg are 1.25 and 1.3 eV for 4 h and 5 h sulfured PA 6 respectively. Copper XPS spectra analyses showed Cu(I) bonds only in deeper layers of the formed film, while in sulfur XPS S 2p spectra dominating sulfide bonds were found after cleaning the surface with Ar
%U http://www.hindawi.com/journals/ijp/2009/304308/