%0 Journal Article
%T Estimation of mass thickness response of embedded aggregated silica nanospheres from high angle annular dark-field scanning transmission electron micrographs
%A Matias Nordin
%A Christoffer Abrahamsson
%A Charlotte Hamngren Blomqvist
%A Magnus R£¿ding
%A Eva Olsson
%A Magnus Nyd¨¦n
%A Mats Rudemo
%J Physics
%D 2013
%I arXiv
%X In this study we investigate the functional behavior of the intensity in high-angle annular dark field (HAADF) scanning transmission electron micrograph (STEM) images. The model material is a silica particle (20 nm) gel at 5 wt%. By assuming that the intensity response is monotonically increasing with increasing mass thickness of silica, an estimate of the functional form is calculated using a maximum likelihood approach. We conclude that a linear functional form of the intensity provides a fair estimate but that a power function is significantly better for estimating the amount of silica in the z-direction. The work adds to the development of quantifying material properties from electron micrographs, especially in the field of tomography methods and three-dimensional quantitative structural characterization from a STEM micrograph. It also provides means for direct three-dimensional quantitative structural characterization from a STEM micrograph.
%U http://arxiv.org/abs/1308.5958v1