%0 Journal Article
%T Effect of annealing on the superconducting properties of a-Nb(x)Si(1-x) thin films
%A O. Crauste
%A A. Gentils
%A F. Cou£¿do
%A Y. Dolgorouky
%A L. Berg¨¦
%A S. Collin
%A C. A. Marrache-Kikuchi
%A L. Dumoulin
%J Physics
%D 2013
%I arXiv
%R 10.1103/PhysRevB.87.144514
%X a-Nb(x)Si(1-x) thin films with thicknesses down to 25 {\AA} have been structurally characterized by TEM (Transmission Electron Microscopy) measurements. As-deposited or annealed films are shown to be continuous and homogeneous in composition and thickness, up to an annealing temperature of 500{\deg}C. We have carried out low temperature transport measurements on these films close to the superconductor-to-insulator transition (SIT), and shown a qualitative difference between the effect of annealing or composition, and a reduction of the film thickness on the superconducting properties of a-NbSi. These results question the pertinence of the sheet resistance R_square as the relevant parameter to describe the SIT.
%U http://arxiv.org/abs/1304.4629v1