%0 Journal Article
%T Main Magnetic Focus Ion Source: II. The first investigations at 10 keV
%A V. P. Ovsyannikov
%A A. V. Nefiodov
%J Physics
%D 2015
%I arXiv
%X The basic principles of design for the compact ion source of new generation are presented. The device uses the local ion trap created by the axial electron beam rippled in a thick magnetic lens. In accordance with this feature, the ion source is given the name main magnetic focus ion source. The experimental evidences for the production of Ir$^{59+}$, Xe$^{44+}$, and Ar$^{16+}$ ions are obtained. The control over depth of the local ion trap is shown to be feasible.
%U http://arxiv.org/abs/1506.00127v1