%0 Journal Article
%T Fourier Transform Analysis of STM Images of Multilayer Graphene Moir¨¦ Patterns
%A Fr¨¦d¨¦ric Joucken
%A Fernande Frising
%A Robert Sporken
%J Physics
%D 2014
%I arXiv
%X With the help of a simple model, we analyze Scanning Tunneling Microscopy images of simple and double moir\'e patterns resulting from misoriented bi- and tri-layers graphene stacks. It is found that the model reproduces surprisingly well non-trivial features observed in the Fast Fourier Transform of the images. We point out difficulties due to those features in interpreting the patterns seen on the FFT.
%U http://arxiv.org/abs/1409.3105v1