%0 Journal Article
%T Direct optical nanoscopy with axially localized detection
%A N. Bourg
%A C. Mayet
%A G. Dupuis
%A T. Barroca
%A P. Bon
%A S. L¨¦cart
%A E. Fort
%A S. L¨¦v¨ºque-Fort
%J Physics
%D 2014
%I arXiv
%R 10.1038/nphoton.2015.132
%X Evanescent light excitation is widely used in super-resolution fluorescence microscopy to confine light and reduce background noise. Herein we propose a method of exploiting evanescent light in the context of emission. When a fluorophore is located in close proximity to a medium with a higher refractive index, its near-field component is converted into light that propagates beyond the critical angle. This so-called Supercritical Angle Fluorescence (SAF) can be captured using a hig-NA objective and used to determine the axial position of the fluorophore with nanometer precision. We introduce a new technique for 3D nanoscopy that combines direct STochastic Optical Reconstruction Microscopy (dSTORM) imaging with dedicated detection of SAF emission. We demonstrate that our approach of a Direct Optical Nanoscopy with Axially Localized Detection (DONALD) yields a typical isotropic 3D localization precision of 20 nm.
%U http://arxiv.org/abs/1410.1563v1