%0 Journal Article
%T Solid-State Reaction and Vacancy-Type  Defects in Bilayer Fe/Hf Studied by the Slow Positron Beam
%A K. Yamada
%A T. Sasaki
%A T. Nagata
%A I. Kanazawa
%A R. Suzuki
%A T. Ohdaira
%A K. Nozawa
%A F. Komori
%J Journal of Applied Mathematics and Physics
%P 233-239
%@ 2327-4379
%D 2015
%I Scientific Research Publishing
%R 10.4236/jamp.2015.32034
%X <p class=\"MsoNormal\">
	<span lang=\"EN-US\">The positron annihilation
lifetimes and the Doppler broadening by slow positron beam are measured in thin
Fe films with thickness 500 nm, a thin Hf film with thickness 100 nm, and the
bilayer Fe (50 nm)/Hf (50 nm) on quartz glass substrate. We have analyzed the behavior
in vacancy-type defects in each layer through some deposition temperatures and
annealing. It is observed that the thin Fe film, the thin Hf film, and the
bilayer Fe (50 nm)/Hf (50 nm) already contain many vacancy-type defects. We
have investigated the change of densities of the vacancy-carbon complex and the
small vacancy-cluster with carbons, through solid-state amorphization of Fe (50
nm)/Hf (50 nm) bilayer.</span>
</p>
%K Metallic Films
%K Positron Annihilation Measurement
%K Solid-State Reaction
%K Fe Film
%K Diffusion
%K Vacancy-Type Defects
%U http://www.scirp.org/journal/PaperInformation.aspx?PaperID=53699