%0 Journal Article
%T Phase Identification Using Series of Selected Area Diffraction Patterns and Energy Dispersive Spectrometry within TEM
%A Kun-Lin Lin
%J Microscopy Research
%P 57-66
%@ 2329-3314
%D 2014
%I Scientific Research Publishing
%R 10.4236/mr.2014.24008
%X Transmission electron microscopy (TEM) is a very powerful technique for materials characteriza-tion, providing information relating to morphology, composition, and crystal structure. Selected area diffraction patterns (SADPs) are crystallographic data that can be obtained using a TEM in-strument. Conventional identification through SADP/TEM is tricky and tedious, thereby increasing the difficulty of phase identification. To establish a procedure for phase identification of known and unknown phases, in this study we examined two samples: one, a known phase, was Si with &lt;100&gt; alignment; the other, unknown, was the Ti<sub>x</sub>O<sub>y</sub> phase at the 96.4Au-3Ni-0.6Ti interlayer/ yttria-stabilized zirconia (YSZ) interface of a steel/96.4Au-3Ni-0.6Ti interlayer/YSZ joint. The procedures for phase identification of the known and unknown phases are described herein using a series of SADPs and energy dispersive spectrometry within TEM that would be useful for general researchers.
%K Phase Identification
%K Transmission Electron Microscopy
%K Selected Area Diffraction Pattern
%K Energy Dispersive Spectroscopy
%U http://www.scirp.org/journal/PaperInformation.aspx?PaperID=50833