%0 Journal Article
%T Determination and Analysis of Structural and Optical Properties for Thermally Evaporated ZnO Thin Films
%A Fatemeh Rahimi
%A Ali Rahmati
%A Soheila Mardani
%J Soft Nanoscience Letters
%P 1-5
%@ 2160-0740
%D 2014
%I Scientific Research Publishing
%R 10.4236/snl.2014.41001
%X <span>ZnO films have been deposited on glass slide substrates at room temperature by thermal evaporation technique. The prepared samples were annealed at temperature of 300ˇăC and 400ˇăC in air atmosphere. Optical and struc</span><span>tural properties of as-deposited films have been compared by that of the annealed samples. X-ray diffraction (XRD) patterns of the obtained films showed that they have polycrystalline and exhibit wurtzite structure. Mi</span><span>cro-structural properties such as mean crystallite size and micro-strain were discussed from XRD peak broa</span><span>dening. Optical properties were identified by measuring transmittance using UV-Vis spectrophotometer. The optical constants such as the refractive index n, extinction coefficient k as well as filmsˇŻ thickness were calculated in the spectral range of 350</span><span>-</span><span>800 nm from transmittance data using a reverse engineering method (point-wise unconstrained minimization approach, PUMA). Dispersion of refractive index shows similar trend as Cauchy relation. Absorption coefficient depicts a maximal value around 3.33 eV for annealed samples. Using balance between electrical power and emissive power, the temperature of tungsten furnace was calculated under deposi</span><span>tion condition. <span>The connection between temperature and vapor pressure of ZnO was estimated by the Clau</span></span><span>sius-Clapyeron equation and thermochemical data.</span>
%K Transmission Spectrum
%K Optical Properties
%K PUMA
%K Clausius-Clapyeron Equation
%U http://www.scirp.org/journal/PaperInformation.aspx?PaperID=41605