%0 Journal Article
%T Investigation of crack origin in hybrid components with twocolor digital Fresnel holography
%A Tankam P.
%A Mounier D.
%A Moisson E.
%A Picart P.
%J EPJ Web of Conferences
%D 2010
%I 
%R 10.1051/epjconf/20100630003
%X The paper presents a two-color digital holographic interferometer. The set-up is devoted to the investigation of crack origin in hybrid industrial electronic components. Optical configuration and algorithms to recover the optical phase of two-color digitally encoded holograms are described. The method is based on a spatial-color-multiplexing scheme in which holographic reconstruction is performed using a spectral scanning algorithm. Experimental results exhibit in-plane and out-of-plane non uniform deformations that are the probable cause of the cracking of the component.
%U http://dx.doi.org/10.1051/epjconf/20100630003