%0 Journal Article
%T A Comparative Study of Dislocations in HVPE GaN Layers by High-Resolution X-Ray Diffraction and Selective Wet Etching
%A Vladimir Ivantsov
%A Anna Volkova
%J ISRN Condensed Matter Physics
%D 2012
%I Hindawi Publishing Corporation
%R 10.5402/2012/184023
%U http://dx.doi.org/10.5402/2012/184023