%0 Journal Article
%T TEST GENERATION FOR ANALOG AND MIXED-SIGNAL CIRCUITS USING HYBRID SYSTEM MODELS
%A Tarik NAHHAL
%A Thao Dang
%J International Journal of VLSI Design & Communication Systems
%D 2011
%I Academy & Industry Research Collaboration Center (AIRCC)
%X In this paper we propose an approach for testing time-domain properties of analog and mixed-signalcircuits. The approach is based on an adaptation of a recently developed test generation technique forhybrid systems and a new concept of coverage for such systems. The approach is illustrated by itsapplication to some benchmark circuits.
%K Hybrid System
%K Formal Methods in Conformance Testing
%K Analog and Mixed-Signal Circuit.
%U http://airccse.org/journal/vlsi/papers/2311vlsics02.pdf