%0 Journal Article
%T Empirical Study on the Burn-in Time of SDRAM Products
%A King-Jang Yang
%A Shun-Hsing Chen
%A C-K Pai
%J Journal of Applied Sciences
%D 2011
%I Asian Network for Scientific Information
%X The burn-in can be used to reduce warranty costs, particularly for products with an initially high failure rate that are sold under warranty. Because previous studies seldom account for burn-in error factors, this study consider such factors in our model to obtain an optimal burn-in time that corresponds more closely with reality. This study focuses on a burn-in test carried out on SDRAM products for the purpose of obtaining reliability and optimal burn-in time and test costs. This study will analyze and validate the data acquired from a life test to determine the types of distributions. The empirical analysis results of this study show that the lifetime of SDRAM products conforms to a Weibull distribution. If the lifetime of an SDRAM product is estimated under such a distribution, a cumulative failure of about 6799 ppm is acquired when the product is operated for one year under normal conditions which is much higher than goal of 100 ppm; thus for the SDRAM products used in this study, the execution of a burn-in is necessary.
%K burn-in test
%K burn-in error
%K Accelerated Life Testing (ALT)
%K reliability objective model
%K reliability test
%U http://docsdrive.com/pdfs/ansinet/jas/2011/2200-2206.pdf