%0 Journal Article
%T Online MOS Capacitor Characterization in LabVIEW Environment
%A Chinmay K Maiti
%A S C Pandey
%A A Maiti
%A T K Maiti
%J International Journal of Online Engineering (iJOE)
%D 2009
%I Kassel University Press
%R 10.3991/ijoe.v5i5.1000
%X We present an automated evaluation procedure to characterize MOS capacitors involving high-k gate dielectrics. Suitability of LabVIEW environment for online web-based semiconductor device characterization is demonstrated. Developed algorithms have been successfully applied to automate the MOS capacitor measurements for Capacitance-Voltage, Conductance-Voltage and Current-Voltage characteristics. Implementation of the algorithm for use as a remote internet-based characterization tool where the client and server communicate with each other via web services is also shown.
%K labview
%K mos
%K capacitor
%K characterization
%K virtual
%K instrumentation
%U http://www.online-journals.org/index.php/i-joe/article/view/1000