%0 Journal Article
%T Modified ATPG method by feeling don¡¯t care bit for optimization of switching activities
%A Chetan Sharma
%J International Journal of Computer Technology and Applications
%D 2011
%I Technopark Publications
%X Test power is major issue of current scenario of VLSI testing. There are different test pattern generation techniques for testing of combinational circuits. This paper gives a new advancement in automatic test pattern generation method by feeling don¡¯t care bit of the test vector to optimize the switching activities. Finally this concept produces low power testing.
%K ATPG method
%K D Routh¡¯s algorithm
%K Boolean difference method
%K Switching activity
%U http://ijcta.com/documents/volumes/vol2issue3/ijcta2011020307.pdf