%0 Journal Article
%T Beam profile indicator for swift heavy ions using phosphor afterglow
%A T. Z. Zhan
%A C. N. Xu
%A H. Yamada
%A Y. Terasawa
%J AIP Advances
%D 2012
%I AIP Publishing LLC
%R 10.1063/1.4739407
%X In this letter, we report a beam profile indicator for swift heavy ions (SHIs) which utilizes the afterglow of phosphors. Clear marks are left on SrAl2O4:Eu2+ and CaSrAl2Si2O8:Eu2+ samples by SHI irradiation through a permanent change of their afterglow intensity. The afterglow intensity of the SHI-irradiated areas has a Gaussian distribution. Moreover, afterglow intensity and irradiation fluence are linearly related, indicating that this type of indicator has good dose linearity. The results suggest that long-lasting phosphors are promising SHI beam profile indicators with high spatial resolution.
%U http://link.aip.org/link/doi/10.1063/1.4739407