%0 Journal Article
%T Application of microscope thermography in testing temperature distribution in a semiconductor laser
%A Janusz Rybinski
%A Michal Bednarek
%A Przemyslaw Wisniewski
%A Tomasz Swietlik
%J Optica Applicata
%D 2010
%I 
%X Microscope thermography with the use of thermovision camera with spatial resolution 8 ¦Ìm was applied in testing temperature distribution in semiconductor lasers produced on the basis of nitrides. The conducted tests have shown that the microscope thermography has a potential in characterizing microelectronic devices like semiconductor laser diodes and can be considered as a complementary tool in establishing thermal characteristics of these devices.
%K microscope thermography
%K blue lasers
%K semiconductor lasers
%U http://www.if.pwr.wroc.pl/~optappl/pdf/2010/no3/optappl_4003p609.pdf