%0 Journal Article
%T Quantitative multichannel NC-AFM data analysis of graphene growth on SiC(0001)
%A Christian Held
%A Thomas Seyller
%A Roland Bennewitz
%J Beilstein Journal of Nanotechnology
%D 2012
%I 
%R 10.3762/bjnano.3.19
%X Noncontact atomic force microscopy provides access to several complementary signals, such as topography, damping, and contact potential. The traditional presentation of such data sets in adjacent figures or in colour-coded pseudo-three-dimensional plots gives only a qualitative impression. We introduce two-dimensional histograms for the representation of multichannel NC-AFM data sets in a quantitative fashion. Presentation and analysis are exemplified for topography and contact-potential data for graphene grown epitaxially on 6H-SiC(0001), as recorded by Kelvin probe force microscopy in ultrahigh vacuum. Sample preparations by thermal decomposition in ultrahigh vacuum and in an argon atmosphere are compared and the respective growth mechanisms discussed.
%K FM-AFM
%K graphene
%K 6H-SiC(0001)
%K KPFM
%K SPM
%U http://dx.doi.org/10.3762/bjnano.3.19