%0 Journal Article
%T Analyzing of Pseudo-Ring Memory Self- Testing Schemes with Algorithms
%A Ghenadie Bodean
%A Wajeb Gharibi
%J International Journal of Distributed and Parallel Systems
%D 2012
%I Academy & Industry Research Collaboration Center (AIRCC)
%X In this paper, scan and ring schemes of the pseudo-ring memory self-testing are investigated. Both schemes are based on emulation of the linear or nonlinear feedback shift register by memory itself. Peculiarities of the pseudo-ring schemes implementation for multi-port and embedded memories, and for register file are described. It is shown that only small additional logic is required and allows microcontrollers at-speed testing. Moreover, posteriori values are given for some types of memories faults coverage when pseudo-ring testing schemes are applied.
%K Mmemory Self-Testing
%K Embedded Testing
%K Built-In Pseudo-Ring Testing
%U http://airccse.org/journal/ijdps/papers/0712ijdps03.pdf