%0 Journal Article
%T Novel Complete Probabilistic Models of Random Variation in High Frequency Performance of Nanoscale MOSFET
%A Rawid Banchuin
%J Journal of Electrical and Computer Engineering
%D 2013
%I Hindawi Publishing Corporation
%R 10.1155/2013/189436
%U http://dx.doi.org/10.1155/2013/189436