%0 Journal Article
%T A Parallel Test Generation Algorithm Based on Fault Partitioning<br>基于故障划分的并行测试生成算法
%A ZENG Zhi-de
%A ZENG Xian-jun
%A <br>曾芷德
%A 曾献君
%J 软件学报
%D 1999
%I 
%X In this paper, the authors analyze in theory how to increase the speed-up ratio of parallel test generation algorithm based on fault partitioning. The approach of backward fault partitioning of output fan-in cones (BFPOC) which combines the relevant fault recognition and shortest path sensitization, is presented. And BFPOC is compared via experiment with the approach of toward fault partitioning of input fan-out cones (TFPIC) proposed by Banejee and the general one, equal distance partitioning of fault sequence (EDPFS). The experimental results show that in large-scale parallel processing environment, BFPOC can reach higher speed-up ratio, obvious super to the other two approaches.
%K Parallel test generation
%K fault parallelism
%K fault partitioning
%K output fan-in cones
%K input fan-out cones
%K speed-up ratio<br>并行测试生成
%K 故障并行
%K 故障划分
%K 输出扇入锥
%K 输入扇出锥
%K 加速比
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=8240383F08CE46C8B05036380D75B607&jid=7735F413D429542E610B3D6AC0D5EC59&aid=2AF3E2922C7A709F32E6BDB520F87475&yid=B914830F5B1D1078&vid=F3090AE9B60B7ED1&iid=708DD6B15D2464E8&sid=38FD6970749494EF&eid=C9D6A9952042973F&journal_id=1000-9825&journal_name=软件学报&referenced_num=0&reference_num=16