%0 Journal Article
%T METHOD FOR POLYFAMILY PLANE TRACE ANALYSIS AND ITS APPLICATION
%A LI Yuqing Research Institute of Daye Steel Works
%A Huangshi
%A China Senior Engineer
%A Research Institute of Daye Steel Works
%A Huangshi
%A China
%A <br>LI Yuqing Research Institute of Daye Steel Works
%A Huangshi
%A China Senior Engineer
%A Research Institute of Daye Steel Works
%A Huangshi
%A China
%J 金属学报(英文版)
%D 1993
%I 
%X The formula for calculating included angle between polufamily plane traces of lattice systems in thin foit under hath zero tilt and non-zero tilt states was deduced and verified by certain prat tical examples.The method may be available to index the plane traces of slip.twin and other defects.especially to determine such planar defects as twin and other defects esperially
%K polyfamily plane
%K included trace angle
%K foil
%K tilt<br>
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=AB188D3B70B071C57EB64E395D864ECE&jid=C19B08D052F5FD8445F4BB80A1A5D7BF&aid=6FA2FD044A3FB43C22EAFF6B80CEC03A&yid=D418FDC97F7C2EBA&vid=B31275AF3241DB2D&iid=CA4FD0336C81A37A&sid=6AC2A205FBB0EF23&eid=5C3443B19473A746&journal_id=1006-7191&journal_name=金属学报(英文版)&referenced_num=0&reference_num=6