%0 Journal Article
%T NUMERICAL CHARACTERIZATION OF CURRENT-INDUCED CHANGESIN SURFACE MORPHOLOGY OF THIN Ag FILMS<br>NUMERICAL CHARACTERIZATION OF CURRENT-INDUCED CHANGES IN SURFACE MORPHOLOGY OF THIN Ag FILMS
%A AVPanin
%A H-GChun
%A ARShugurov
%A SVPanin
%A NVPykhtin
%A <br>A.V. Panin
%A H.-G. Chun
%A A.R. Shugurov
%A S.V. Pan-in and N.V. Pykhtin Institute of Strength Physics and Materials Science SB RAS
%A Tomsk
%A Russia ReMM
%A School of Materials Science and Engineering
%A University of Ulsan
%A Ulsan
%A Korea Tomsk Polytechnical University
%A Tomsk
%A Russia
%J 金属学报(英文版)
%D 2003
%I 
%X The changes in surface topography of thin conducting Ag films under high-density current condition are studied by optical and scanning tunnelling microscopy (STM). It is established that the loss of conductivity in specimens occurs through depletion of the material due to their overheating and electromigration process. It has been shown that the r.m.s. roughness, the fractal dimension of voids and the fractal dimension of the surface allow complete numerical characterization of surface topography changes in thin Ag films.
%K STM
%K thin Ag films
%K surface roughness
%K fractal dimension<br>
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=AB188D3B70B071C57EB64E395D864ECE&jid=C19B08D052F5FD8445F4BB80A1A5D7BF&aid=6D7D45AD1C8E21B1C6FB8EC1D45EEDF6&yid=D43C4A19B2EE3C0A&vid=7801E6FC5AE9020C&iid=E158A972A605785F&sid=D537C66B6404FE57&eid=627456E7977439A4&journal_id=1006-7191&journal_name=金属学报(英文版)&referenced_num=0&reference_num=5