%0 Journal Article
%T INVESTIGATION OF BONDING IN NANO-SiO2 BY Si L2,3 X-RAY ABSORPTION NEAR-EDGE STRUCTURE SPECTROSCOPY<br>INVESTIGATION OF BONDING IN NANO-SiO_2 BY Si L_(2,3) X-RAY ABSORPTION NEAR-EDGE STRUCTURE SPECTROSCOPY
%A ZY Wu
%A <br>Z.Y. Wu
%A K. Ibrahim
%A G. Li
%A J. Zhang
%A F.Q. Liu
%A M.I Abbas
%A R. Hu
%A H.J. Qian and F.Q. Tang
%J 金属学报(英文版)
%D 2001
%I 
%X The Si L2,3 X-ray absorption near-edge structure (XANES) can be used to probe the local structure around Si and derive electronic information of the unoccupied s- and d-like partial density of states in nano-size SiO2. We present Si L2,3-edge for three different size silicates acquired by total electron yield (TEY) at the photoemission station of Beijing Synchrotron Radiation Facility (BSRF). The Si L2,3-edge spectra are interpreted based on ab initio full multiple-scattering (MS) calculation. The Si L2,3-edge of nano-size materials has XANES similar to that of a-quartz. The similarities between the Si L2,3-edge shapes attest to a common molecular-orbital picture of their Si-O bonding and the same coordination state. However, a considerable broadening of Si L2,3-edge XANES spectra as decrease of particle size is also an indicative of polyhedral distortions.
%K multiple scattering calculation
%K X-ray absorption
%K nano particle
%K electronic structure<br>
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=AB188D3B70B071C57EB64E395D864ECE&jid=C19B08D052F5FD8445F4BB80A1A5D7BF&aid=24AA60BFDBBD5618DF6867745B60CE45&yid=14E7EF987E4155E6&vid=F3583C8E78166B9E&iid=B31275AF3241DB2D&sid=8143FF92EEF26F96&eid=A94616C4391AA5EF&journal_id=1006-7191&journal_name=金属学报(英文版)&referenced_num=0&reference_num=27