%0 Journal Article
%T AN ADVANCED TECHNIQUE FOR THE TEXTURES MEASUREMENT ANDANALYSIS FOR THE MULTILAYER MATERIALS<br>AN ADVANCED TECHNIQUE FOR THE TEXTURES MEASUREMENTAND ANALYSIS FOR THE MULTILAYER MATERIALS
%A Y D Liu
%A G Wang
%A CS He
%A YD Whng
%A JZ Xu
%A <br>Y. D. Liu
%A G. Wang
%A C.S. He
%A Y.D. Whng and J.Z. Xu
%J 金属学报(英文版)
%D 1999
%I 
%X In view of being difficult to find a non-oriented multilayer specimen, the precise defocusing correction become a particular obstacle of quantitative texture analyszs of the multzlayer. A new method is employed in this paper for comcting the eoperzment data. And a theoretical calculation for the defocus curre is proposed thinking about both thc dtherent film thickness and the penetration depth of the incident beam in the films. A critical value jor the defocusing cormction in the film is alsi cinsidered. This new tcchnique is applied to the Zn-Cu multilayer for which the quantitative texture analysis is completed by the modified maxitnum entropy tnethod.
%K multilayer
%K x-ray diffraction
%K texture<br>
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=AB188D3B70B071C57EB64E395D864ECE&jid=C19B08D052F5FD8445F4BB80A1A5D7BF&aid=BA24AEE41F756AFFB5C29505F1E07CE3&yid=B914830F5B1D1078&vid=59906B3B2830C2C5&iid=B31275AF3241DB2D&sid=D45398EB9ED445AA&eid=F58A98E9A761BF85&journal_id=1006-7191&journal_name=金属学报(英文版)&referenced_num=0&reference_num=12