%0 Journal Article
%T CONTAMINATION LINE METHOD AND COMPARISON OF FOIL THICKNESS MEASUREMENT METHODS IN TRANSMISSION ELECTRON MICROSCOPY
%A PAN ZhenpengGuangdong Mechanical College Guangzhou China
%A <br>PAN
%A ZhenpengGuangdong
%A Mechanical
%A College.
%A Guangzhou.
%A China
%J 金属学报(英文版)
%D 1994
%I 
%X The paper briefly introduces the Contamination Line Method for foil thickness measurement in transmission electron microscopy and compares it with four conventional methods: the convergent beam diffraction method, the contamination spot method, the methods hased on characteristic X-ray emission and continuous X-ray emission on the application, aperation and accuracy etc.
%K transmission electron microscopy
%K foil thickness measurement<br>
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=AB188D3B70B071C57EB64E395D864ECE&jid=C19B08D052F5FD8445F4BB80A1A5D7BF&aid=7C33A3E35FDCD8B964F5F995B6AF7EC7&yid=3EBE383EEA0A6494&vid=DF92D298D3FF1E6E&iid=38B194292C032A66&sid=A58CF3BAE79427D0&eid=4609832E4B5C797B&journal_id=1006-7191&journal_name=金属学报(英文版)&referenced_num=0&reference_num=9