%0 Journal Article
%T Easy Test Generation PLAs
%A Min
%A Yinghua
%J 计算机科学技术学报
%D 1987
%I 
%X Test Generation for large circuits may be extremely difficult.One of the approaches to alleviatingthis problem is to consider the difficulties during the design cycle.This paper proposes a design of EasyTest Generation Programmable Logic Arrays(ETG PLAs),for which test generation is basically notrequired,since a complete test set can be generated while the test is applied.This paper also presents aprocedure which makes a PLA an ETG PLA by following some design rules and providing reasonableextra hardware.
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=8240383F08CE46C8B05036380D75B607&jid=F57FEF5FAEE544283F43708D560ABF1B&aid=330905A774E7FBB2BB9BB1EC016A0287&yid=9C2DB0A0D5ABE6F8&vid=0B39A22176CE99FB&iid=CA4FD0336C81A37A&sid=AA76E167F386B6B3&eid=E203FB1A272C9DD2&journal_id=1000-9000&journal_name=计算机科学技术学报&referenced_num=0&reference_num=0