%0 Journal Article
%T Analog circuit test stimuli optimal method based on fault detectable analysis and genetic algorithm<br>基于故障可诊性与遗传算法的模拟电路测试激励优化方法*
%A JIANG Yuan-yuan
%A WANG You-ren
%A CUI Jiang
%A LUO Hui
%A ZHAO Peng
%A <br>姜媛媛
%A 王友仁
%A 崔江
%A 罗慧
%A 赵鹏
%J 计算机应用研究
%D 2011
%I 
%X The selection of test stimuli has an influence on circuit fault diagnosis precision. First, executing 10 octave AC Sweep analysis on the circuit under test (CUT) so that the frequency range of sine wave can be set, and then calculate the inner and-inter class distance and sensitivity factor value based on the discrete frequency-rms voltage response data which acquired under different fault type circuit simulation, finally finish the test stimuli optimal design through the genetic algorithm with sensitivity factor as its objective function. A double-bandpass filter circuit is used to validate the proposed method, and the experimental results show that the optimal test stimuli can effectively reduce the ambiguty of different fault feature distribution and reach a satisfied diagnosis result.
%K analog circuit
%K test stimuli
%K optimal design
%K fault detectable analysis
%K genetic algorithm<br>模拟电路
%K 测试激励
%K 优化设计
%K 故障可诊性
%K 遗传算法
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=8240383F08CE46C8B05036380D75B607&jid=A9D9BE08CDC44144BE8B5685705D3AED&aid=0B386E261F5D638FFDBF8DDD5047D8A5&yid=9377ED8094509821&vid=D3E34374A0D77D7F&iid=38B194292C032A66&sid=8587C7CAA7A3D0DB&eid=40541F483644ACC4&journal_id=1001-3695&journal_name=计算机应用研究&referenced_num=0&reference_num=15