%0 Journal Article
%T SoC test data compression and decompression with improved FDR code<br>改进型FDR码对SoC测试数据的压缩及解压缩*
%A OUYANG Yi-ming
%A GUO Wen-peng
%A LIANG Hua-guo
%A <br>欧阳一鸣
%A 郭文鹏
%A 梁华国
%J 计算机应用研究
%D 2008
%I 
%X To reduce the volume of SoC test data, an improved FDR code was proposed, called IFDR code. Unlike FDR code, it encoded both runs of 0s and 1s with same codes, considering test sequences as distributions of 0 string and 1 string. Due to its simple architecture, the decompression circuit for IFDR code needed very little additional hardware. Experimental results for the ISCAS 89 benchmark circuits show that IFDR code outperforms FDR code and other similar codes in achieving higher compression ratio.
%K 测试源划分
%K 压缩/解压缩
%K FDR码
%K 系统级芯片
%U http://www.alljournals.cn/get_abstract_url.aspx?pcid=5B3AB970F71A803DEACDC0559115BFCF0A068CD97DD29835&cid=8240383F08CE46C8B05036380D75B607&jid=A9D9BE08CDC44144BE8B5685705D3AED&aid=3BA54D3AB4C0F829193B0FAFE147DDD8&yid=67289AFF6305E306&vid=C5154311167311FE&iid=CA4FD0336C81A37A&sid=0584DB487B4581F4&eid=DABEF202280E7EF1&journal_id=1001-3695&journal_name=计算机应用研究&referenced_num=0&reference_num=8